Materials & Plated：

Plunger：Becu，Au/Ni Plated 

Barrel：Ph，Au Plated 

Spring：SWP，Au Plated
Casing：Ph，Au Plated 

Electrical Spec.：

Centers)：1.27 mm(50 mil)
Mouting Hole Size：ø1.00mm

Full Stroke：6.40 mm

Rated Stroke：4.30 mm

Rated Force：100gf(3.6 oz) / 150gf(5.5 oz) / 200gf(7.2 oz)
Current Rating：3 A（Continuous）
Contact Resistance：60 mΩ（Max）

ICT probe mainly used for in-circuit testing and functional testing, detecting the electrical performance of in-circuit components and the connection of circuit networks. They are able to quantitatively measure and perform functional testing on components.

Usually, ICT probes are used with receptacles of matching sizes, which are fixed on PCB for replacement of probes anytime.