Materials & Plated：
Plunger：Becu/SK4，Au on Ni Plated
Barrel：Ph/Br，Au on Ni Plated
Spring：SWP/SUS，Au on Ni Plated
Casing：Ph/Br，Au on Ni Plated
Electrical Spec.：
Pitch：3.18 mm(125 mil)
Rated Current：3 Amps，Continuous
Rated Resistance：30 mΩ
Mounting Hole Size：ø2.40 mm
Full Stroke：6.35 mm
Rated Stroke：4.32 mm
Rated Force：113/198/255/285 gf(4.0/7.0/9.0/10.0 oz)
ICT probe mainly used for in-circuit testing and functional testing, detecting the electrical performance of in-circuit components and the connection of circuit networks. They are able to quantitatively measure and perform functional testing on components.
Usually, ICT probes are used with receptacles of matching sizes, which are fixed on PCB for replacement of probes anytime.
ICT probes are also called ICT probes.Usually, ICT probes are used with receptacles of matching sizes, which are fixed on PCB for replacement of probes anytime.
ICT probe mainly used for in-circuit testing and functional testing, detecting the electrical performance of in-circuit components and the connection of circuit networks. They are able to quantitatively measure and perform functional testing on components.
