Materials & Plated：
Barrel：Ph/SP，Au on Ni Plated
Plunger 1：SK4/Becu，Au on Ni Plated ; PD，No Plated
Plunger 2：SK4/Becu，Au on Ni Plated ; PD，No Plated
Spring：SWP/SUS，Au on Ni Plated
电子参数(Electrical Spec.：
Current Rating：3 Amps
Bandwidth：-1 dB@27.9 GHz
Inductace：1.17 nH
Captance：1.48 pF
Semiconductor test probes are also called "double-ended test probes". The probes loaded with common tip styles, namely, B, J, J1, U, U1, etc., are small in size and require high test accuracy. According to the structure, they can be divided into single acting probes and double acting probes.
They are mainly used in various communication power electronic components, semiconductor wafer testing, chip packaging testing, extremely low contact resistance and ultra-high bandwidth(5-40GHz) testing.
Ability: minimum diameter(plunger φ0.06mm / barrel φ0.10mm).
Semiconductor test probes are also known as "double-ended test probes". According to structure, they can be divided into single acting probes and double acting probes. Common tip types are B, J, J1, U, U1, etc.. The probes are small and have strict requirements in test accuracy .
At present, for this type of products, Centalic can process the minimum probe diameter: Probe head φ： 0.06mm/Probe barrel φ： 0.10mm.
Semiconductor test probes are mainly used for vcommunication power electronic components, semiconductor wafer testing, chip packaging testing, extremely low contact resistance and ultra-high bandwidth(5-40GHz) testing.
